Material Analysis
Fourier Transform-Infrared Spectroscopy (FTIR)
FTIR is one of the most commonly used analytical techniques for identifying organic materials. This technique measures the absorption of infrared (IR) radiation by the tested sample in comparison to the wavelength. The IR absorption band identifies molecular components and structures. It is useful especially in identification and characterisation of complex mixtures in all material states, be it solid, liquid or gas.
Application:
Foreign materials identification, bulk material compound identification
Raman Spectroscopy
Raman Spectroscopy is one of the ideal analytical techniques for qualitative analysis. It is flexibly useful both for organic and inorganic mixed materials in quantitative or semi-quantitative analysis. Raman is typically designed by illuminating the sample with laser beam and the photons will be scattered with change of energy (Raman scattering) after interacting with the molecular bonds. And these photons are collected and analysed through monochromator lens.
Application:
Foreign materials identification, compound identification, carbon material analysis
Raman mapping of naphthalene sample
X-Ray Diffraction (XRD)
XRD is a rapid analytical technique primarily used for phase identification of a crystalline material and can provide information on unit cell dimensions. X-ray beam is incident on sample surface at different angle and and measuring the angles and intensities of the diffracted X-ray beams, unknown material can be identified with its own signature XRD peaks.
Application:
Minerals phase/composition identification, crystallinity study
X-Ray Fluorescence (XRF)
XRF is a non-destructive analytical technique used to determine the elemental composition of materials. Fluorescent/secondary X-ray is produced when excited by the X-Ray source, each of the elements present in a sample produces a set of characteristic fluorescent X-rays that is unique for the particular element. XRF results can be complementary to XRD for phase/composition quantification.
Application:
Elemental analysis, coating thickness measurement
Auger Electron Spectroscopy (AES)
AES uses the principle of Auger effect, which is based on the analysis of energetic electrons emitted from an excited atom after a series of internal relaxation events. The typical penetration depth of AES is 2 – 5 nm, making it a surface-sensitive analytical technique.
Application: Surface elemental analys
X-Ray Photoelectron Spectroscopy (XPS)
XPS can measure the elemental composition, empirical formula, chemical state and electronic state of the elements within a material. XPS spectra are obtained by irradiating sample surface with X-ray beam and a photoelectron spectrum is recorded by counting ejected electrons over a range of electron kinetic energies from surface (2 – 6nm) of the samples. Peaks appear in the spectrum from atoms emitting electrons of a particular characteristic energy. The energies and intensities of the photoelectron peaks enable identification and quantification of all surface elements.
Application: Surface analysis, depth profiling, chemical state analysis
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
ToF-SIMS uses a focused, pulsed ion beam to sputter molecules on the sample's surface. Particles closer to the site of impact tend to be dissociated ions and secondary particles generated farther from the impact tend has more of molecular compounds. These particles will accelerate on a flight path to the detector and the time they reach the detected is measured and then characterized.
Application: Surface analysis, depth profiling, contaminant analysis
Electron Energy Loss Spectroscopy (EELS)
EELS is a high-sensitivity, non-destructive technique for analysing surface and low-energy electronic excitation. It collects more signals than EDS and is ideal for Elemental identification and mapping. EELS is commonly used with TEM to provide elemental information on nanoscale.
Electron backscatter diffraction (EBSD)
EBSD is an advance technique generally used with the SEM. It provides quantitative micro-structural information about the crystallographic nature of semiconductor, metal, mineral, ceramic and even inorganic crystalline material.